3 Nannan He Philpp Ruemmer Daniel Kroening 2011 Test-Case Generation for Embedded Simulink via Formal Concept Analysis Design Automation Conference mutation-based test-case generation embedded software Simulink change impact analysis concept lattice <p>Mutation testing su ers from the high computational cost of<br />automated test-vector generation, due to the large number<br />of mutants that can be derived from programs and the cost<br />of generating test-cases in a white-box manner. We propose<br />a novel algorithm for mutation-based test-case generation<br />for Simulink models that combines white-box testing with<br />formal concept analysis. By exploiting similarity measures<br />on mutants, we are able to e ectively generate small sets of<br />short test-cases that achieve high coverage on a collection of<br />Simulink models from the automotive domain. Experiments<br />show that our algorithm performs signi cantly better than<br />random testing or simpler mutation-testing approaches.</p> http://www.kroening.com/publications/view-publications-hrk2011-dac.html